Multi-run Memory Tests for Pattern Sensitive Faults by Ireneusz Mrozek

Multi-run Memory Tests for Pattern Sensitive Faults by Ireneusz Mrozek

Author:Ireneusz Mrozek
Language: eng
Format: epub, pdf
Publisher: Springer International Publishing, Cham


Proof

The necessary condition for the bit sequence a i is equal numbers of 0’s and 1’s within this sequence a i, which is the direct result of Property 6.2. Suppose that some subset of r < m bit sequences are linear dependent, then we can write the equation:

From the last equation, it is possible to come to the conclusion that there are no binary combinations with an odd number of ones for the sequences a i, a j, …, a q, which is a contradiction to the Property 6.4. This is a sufficient condition for the bit sequence b i. □



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